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Events |
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Workshop - JTAG
Boundary Scan - Concepts Tools & Design for Test (DFT)
Date : 06th February 2014
Join us along with with XJTAG, Cambridge, UK for a Free Work
Shop on Jtag |
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Boundary Scan - Concepts Tools & Design for Test (DFT)
on 6th February 2014 at Bangalore.
JTAG and boundary scan are common names for the IEEE standard
1149.x. Learn more about boundary scan technology with
'hands-on' workshop. Discover the problems the technology can
solve, and how to make best use of it as an electronic circuit
design engineer. The workshop is a primer to see how boundary
scan can be used from start to finish, both to improve designs
and reduce respins as well as to enhance test coverage, fault
diagnosis and production yields on complex BGA-populated
circuits. The workshop will also cover how to test non-JTAG
devices using boundary scan. |
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Who can attend this
Workshop : |
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This workshop is an ideal opportunity for engineers involved
in design, development, test and manufacture to discover how
using XJTAG can speed up the process of debugging and testing
their boards throughout the product lifecycle.
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